Can One Test Fit All? Responses to the Article “Striving for Simple but Effective Advice for Comparing the Central Tendency of Two Populations” (Ruxton & Neuhäuser, 2018)

Authors

Diep Nguyen, University of South FloridaFollow
Eun Sook Kim, University of South FloridaFollow
Yi-Hsin Chen, University of South FloridaFollow

Abstract

Responses to suggestions made by Ruxton & Neuhäuser (2018) regarding Nguyen et al. (2016) are given.

DOI

10.22237/jmasm/1552331481

Recommended Citation

Nguyen, D., Kim, E. S., & Chen, Y.-H. (2018). Can One Test Fit All? Responses to the Article “Striving for Simple but Effective Advice for Comparing the Central Tendency of Two Populations” (Ruxton & Neuhäuser, 2018). Journal of Modern Applied Statistical Methods, 17(2), eP2822. doi: 10.22237/jmasm/1552331481