Abstract
Reliability data are generated in the form of success/failure. An attempt was made to model such type of data using binomial distribution in the Bayesian paradigm. For fitting the Bayesian model both analytic and simulation techniques are used. Laplace approximation was implemented for approximating posterior densities of the model parameters. Parallel simulation tools were implemented with an extensive use of R and JAGS. R and JAGS code are developed and provided. Real data sets are used for the purpose of illustration.
DOI
10.22237/jmasm/1553803862
Recommended Citation
Akhtar, M. T., & Khan, A. A. (2018). JMASM 51: Bayesian reliability analysis of binomial model – Application to success/failure data. Journal of Modern Applied Statistical Methods, 17(2), eP2623. doi: 10.22237/jmasm/1553803862
Included in
Applied Statistics Commons, Social and Behavioral Sciences Commons, Statistical Theory Commons
