JMASM 51: Bayesian Reliability Analysis of Binomial Model – Application to Success/Failure Data

Authors

M. Tanwir Akhtar, Saudi Electronic University, Jeddah, Saudi ArabiaFollow
Athar Ali Khan, Aligarh Muslim University, Aligarh, IndiaFollow

Abstract

Reliability data are generated in the form of success/failure. An attempt was made to model such type of data using binomial distribution in the Bayesian paradigm. For fitting the Bayesian model both analytic and simulation techniques are used. Laplace approximation was implemented for approximating posterior densities of the model parameters. Parallel simulation tools were implemented with an extensive use of R and JAGS. R and JAGS code are developed and provided. Real data sets are used for the purpose of illustration.

DOI

10.22237/jmasm/1553803862

Recommended Citation

Akhtar, M. T., & Khan, A. A. (2018). JMASM 51: Bayesian reliability analysis of binomial model – Application to success/failure data. Journal of Modern Applied Statistical Methods, 17(2), eP2623. doi: 10.22237/jmasm/1553803862