The dependent samples t and Wilcoxon sign rank maximum test
Abstract
A maximum test using the parametric dependent samples t-test and the non-parametric Wilcoxon sign rank test was created using a FORTRAN program and various subroutines of the International Mathematical and Statistical Libraries (IMSL, 1980). Two tailed critical values were derived from a mixed normal distribution. Critical values obtained were at the 0.05, 0.025, 0.01 and 0.005 alpha levels via sample sizes (n) 8 through 30, 45, 60, 90 and 120. Critical values were compared to values obtained through the application of the Bonferroni correction method. It was concluded that the Bonferroni is an unnecessary method. Findings of the study are tremendously important for the field inferential statistics. The maximum test is known to restrain Type I error to nominal alpha. The maximum test as created in this study not only rids the problems encountered when choosing one test of significance over another but it also allows a researcher to obtain and interpret results without the concern for Type I error inflation.^
Subject Area
Education, Tests and Measurements|Statistics|Psychology, Psychometrics
Recommended Citation
Saverpierre Maggio,
"The dependent samples t and Wilcoxon sign rank maximum test"
(January 1, 2012).
ETD Collection for Wayne State University.
Paper AAI3544674.
http://digitalcommons.wayne.edu/dissertations/AAI3544674